@book{UBHD-67484431,
  author={Titze, Benjamin},
  title={Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging},
  year={2013},
  pages={112 S.},
  language={eng},
  note={Zsfassung in dt. Sprache},
  school={Heidelberg, Univ., Diss., 2013},
  keywords={Rasterelektronenmikroskopie / Oberfl{\"a}chenladung / Strahlenschaden},
  library={UB [Signatur: 2013 U 963]},
}
@book{UBHD-67671408,
  author={Titze, Benjamin},
  title={Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging},
  year={2013},
  pages={Online-Ressource},
  language={eng},
  school={Heidelberg, Univ., Diss., 2013},
  doi={10.11588/heidok.00015372},
  keywords={Rasterelektronenmikroskopie / Oberfl{\"a}chenladung / Strahlenschaden},
  url={http://www.ub.uni-heidelberg.de/archiv/15372},
  library={UB},
}