@article{UBHD-69103512, author={Cecconi, Leonardo and Piro, F. and Melo, J. L. A. de and Deng, W. and Hong, G. H. and Snoeys, W. and Mager, M. and Suljic, M. and Kugathasan, T. and Buckland, M. and Rinella, G. Aglieri and Leitao, P. V. and Reidt, F. and Baudot, J. and Bugiel, S. and Colledani, C. and Contin, G. and Hu, C. and Kluge, A. and Kluit, R. and Vitkovskiy, A. and Russo, R. and Becht, P. and Grelli, A. and Hasenbichler, J. and Munker, M. and Soltveit, Hans Kristian and Menzel, Marius and Sonneveld, J. and Tiltmann, N.}, title={Design and readout architecture of a monolithic binary active pixel sensor in TPSCo 65 nm CMOS imaging technology}, year={2023}, pages={1-9}, language={eng}, issn={1748-0221}, volume={18}, note={Online ver{\"o}ffentlicht: 9. Februar 2023 ; Gesehen am 01.08.2023}, journal={Journal of Instrumentation}, doi={10.1088/1748-0221/18/02/C02025}, } @article{UBHD-69161531, author={Piro, Francesco and Rinella, G. Aglieri and Andronic, A. and Antonelli, M. and Aresti, M. and Baccomi, R. and Becht, Pascal and Beolè, S. and Braach, J. and Buckland, M. D. and Buschmann, E. and Camerini, P. and Carnesecchi, F. and Cecconi, L. and Charbon, E. and Contin, G. and Dannheim, D. and de Melo, J. and Deng, W. and di Mauro, A. and Vassilev, M. Dimitrova and Emiliani, S. and Hasenbichler, J. and Hillemanns, H. and Hong, G. H. and Isakov, A. and Junique, A. and Kluge, A. and Kotliarov, A. and Křížek, F. and Kugathasan, T. and Lautner, L. and Lemoine, C. and Mager, M. and Marras, D. and Martinengo, P. and Masciocchi, Silvia and Menzel, Marius and Munker, M. and Rachevski, A. and Rebane, K. and Reidt, F. and Russo, R. and Sanna, I. and Sarritzu, V. and Senyukov, S. and Snoeys, W. and Sonneveld, J. and Šuljić, M. and Svihra, P. and Tiltmann, N. and Usai, G. and van Beelen, J. B. and Vernieri, C. and Villani, A.}, title={A compact front-end circuit for a monolithic sensor in a 65-nm CMOS imaging technology}, year={2023}, pages={2191-2200}, language={eng}, issn={1558-1578}, volume={70}, number={9}, note={Gesehen am 16.01.2024}, journal={IEEE transactions on nuclear science}, doi={10.1109/TNS.2023.3299333}, }