Experimental ray-tracing

• Verfasst von: Maetz, Mischa [VerfasserIn]
• Verfasst von: Traxel, Kurt [VerfasserIn]
• Titel: Experimental ray-tracing
• Titelzusatz: a precise and accurate method for the determination of the properties of optical systems
• Verf.angabe: M. Maetz, A. Núñez-Ruiz, T. Schneider, S. Scheloske, A. Wallianos, C. Wies, K. Traxel
• E-Jahr: 1999
• Jahr: 15 November 1999
• Umfang: 7 S.
• Fussnoten: Gesehen am 26.02.2020
• Titel Quelle: Enthalten in: Nuclear instruments & methods in physics research / B
• Ort Quelle: Amsterdam [u.a.] : Elsevier, 1984
• Jahr Quelle: 1999
• Band/Heft Quelle: 158(1999), 1, Seite 90-96
• ISSN Quelle: 1872-9584
• DOI: doi:10.1016/S0168-583X(99)00332-8
• Datenträger: Online-Ressource
• Sprache: eng
• Sach-SW: Ion optics
• Sach-SW: Lens errors
• Sach-SW: Nuclear microprobe
• Sach-SW: Ray-tracing
• Sach-SW: Secondary electrons
• K10plus-PPN: 1570388121

Abstract

We developed a new technique to determine the impact position of single pencil beams in the image plane with an accuracy of 0.2 μm. This technique bases on the overlapping of secondary electron images from a 1000 mesh grid. The measurements themselves can be obtained without any change in the routine setup if a secondary electron counter is installed. By choosing different object positions (x0, y0) and divergence angles (θ0, ϕ0) for the pencil beam the characteristics of the used lens system can be analysed and the lens errors can be calculated with high precision. Results for the Heidelberg quadrupole doublet will be reported.