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Verfasst von:Hietzschold, Sebastian [VerfasserIn]   i
 Hillebrandt, Sabina [VerfasserIn]   i
 Bombsch, Jakob [VerfasserIn]   i
 Rohnacher, Valentina [VerfasserIn]   i
 Pucci, Annemarie [VerfasserIn]   i
 Beck, Sebastian [VerfasserIn]   i
 Lovrinčić, Robert [VerfasserIn]   i
Titel:Functionalized nickel oxide hole contact layers
Titelzusatz:work function versus conductivity
Verf.angabe:Sebastian Hietzschold, Sabina Hillebrandt, Florian Ullrich, Jakob Bombsch, Valentina Rohnacher, Shuangying Ma, Wenlan Liu, Andreas Köhn, Wolfram Jaegermann, Annemarie Pucci, Wolfgang Kowalsky, Eric Mankel, Sebastian Beck and Robert Lovrincic
Umfang:9 S.
Fussnoten:Publication date (web): October 20, 2017 ; Gesehen am 19.06.2018
Titel Quelle:Enthalten in: American Chemical Society: ACS applied materials & interfaces
Jahr Quelle:2017
Band/Heft Quelle:9(2017), 45, S. 39821-39829
ISSN Quelle:1944-8252
Abstract:Nickel oxide (NiO) is a widely used material for efficient hole extraction in optoelectronic devices. However, its surface characteristics strongly depend on the processing history and exposure to adsorbates. To achieve controllability of the electronic and chemical properties of solution-processed nickel oxide (sNiO), we functionalize its surface with a self-assembled monolayer (SAM) of 4-cyanophenylphosphonic acid. A detailed analysis of infrared and photoelectron spectroscopy shows the chemisorption of the molecules with a nominal layer thickness of around one monolayer and gives an insight into the chemical composition of the SAM. Density functional theory calculations reveal the possible binding configurations. By the application of the SAM, we increase the sNiO work function by up to 0.8 eV. When incorporated in organic solar cells, the increase in work function and improved energy level alignment to the donor does not lead to a higher fill factor of these cells. Instead, we observe the formation of a transport barrier, which can be reduced by increasing the conductivity of the sNiO through doping with copper oxide. We conclude that the widespread assumption of maximizing the fill factor by only matching the work function of the oxide charge extraction layer with the energy levels in the active material is a too narrow approach. Successful implementation of interface modifiers is only possible with a sufficiently high charge carrier concentration in the oxide interlayer to support efficient charge transfer across the interface.
DOI:doi:10.1021/acsami.7b12784
URL:Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.

Verlag: http://dx.doi.org/10.1021/acsami.7b12784
 Verlag: https://doi.org/10.1021/acsami.7b12784
 DOI: https://doi.org/10.1021/acsami.7b12784
Datenträger:Online-Ressource
Sprache:eng
K10plus-PPN:1576521311
Verknüpfungen:→ Zeitschrift

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