Characterizing the local vectorial electric field near an atom chip using Rydberg-state spectroscopy

• Verfasst von: Cisternas San Martin, Nataly [VerfasserIn]
• Verfasst von: Lochead, Graham [VerfasserIn]
• Titel: Characterizing the local vectorial electric field near an atom chip using Rydberg-state spectroscopy
• Verf.angabe: N. Cisternas, Julius de Hond, G. Lochead, R.J.C. Spreeuw, H.B. van Linden van den Heuvell, N.J. van Druten
• E-Jahr: 2017
• Jahr: 25 July 2017
• Umfang: 7 S.
• Fussnoten: Gesehen am 03.08.2018
• Titel Quelle: Enthalten in: Physical review
• Ort Quelle: Woodbury, NY : Inst., 2016
• Jahr Quelle: 2017
• Band/Heft Quelle: 96(2017,1) Artikel-Nummer 013425, 7 Seiten
• ISSN Quelle: 2469-9934
• DOI: doi:10.1103/PhysRevA.96.013425
• Datenträger: Online-Ressource
• Sprache: eng
• K10plus-PPN: 1578221714

Abstract

We use the sensitive response to electric fields of Rydberg atoms to characterize all three vector components of the local electric field close to an atom-chip surface. We measured Stark-Zeeman maps of S and D Rydberg states using an elongated cloud of ultracold rubidium atoms (temperature T∼2.5μK) trapped magnetically 100μm from the chip surface. The spectroscopy of S states yields a calibration for the generated local electric field at the position of the atoms. The values for different components of the field are extracted from the more complex response of D states to the combined electric and magnetic fields. From the analysis we find residual fields in the two uncompensated directions of 0.0±0.2 and 1.98±0.09 V/cm. This method also allows us to extract a value for the relevant field gradient along the long axis of the cloud. The manipulation of electric fields and the magnetic trapping are both done using on-chip wires, making this setup a promising candidate to observe Rydberg-mediated interactions on a chip.