Status: Bibliographieeintrag
Standort: ---
Exemplare:
---
| Online-Ressource |
Verfasst von: | Joos, Jochen [VerfasserIn]  |
| Carraro, Thomas [VerfasserIn]  |
Titel: | Electrode reconstruction by FIB/SEM and microstructure modeling |
Verf.angabe: | Jochen Joos, Bernd Rüger, Thomas Carraro, André Weber, Ellen Ivers-Tiffée |
Umfang: | 12 S. |
Fussnoten: | Gesehen am 11.03.2019 |
Titel Quelle: | Enthalten in: Electrochemical Society: ECS transactions |
Jahr Quelle: | 2010 |
Band/Heft Quelle: | 28(2010), 11, S. 81-91 |
ISSN Quelle: | 1938-6737 |
Abstract: | Polarization losses within solid oxide fuel cell electrodes are strongly related to microstructure characteristics and composition. High-resolution microstructure analysis is a sensible method to understand and improve electrode performance. This study presents the application of a dual-beam focused ion beam/scanning electron microscope (FIB/SEM) for the three-dimensional (3D) reconstruction of a high performance LSCF-cathode. Error sources arising from FIB slicing and SEM sequencing are identified and methods of correction are presented. The corrected reconstruction data representing altogether a volume of ~ 2800µm3 are the basis for the calculation of the microstructure parameters (i) surface area, (ii) volume/porosity fraction and (iii) tortuosity. These parameters constitute the basis to calculate cathode performance via simplified microstructure models (1-3). Furthermore we present a detailed 3D finite element method (FEM) model to calculate the tortuosity from the accurately reconstructed 3D FIB/SEM data. This model has been extended to calculate electrode performance (ASRcat) from the 3D reconstruction. |
DOI: | doi:10.1149/1.3495834 |
URL: | Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.
Resolving-System: http://dx.doi.org/10.1149/1.3495834 |
| Verlag: http://ecst.ecsdl.org/content/28/11/81 |
| DOI: https://doi.org/10.1149/1.3495834 |
Datenträger: | Online-Ressource |
Sprache: | eng |
K10plus-PPN: | 1588540138 |
Verknüpfungen: | → Sammelwerk |
Electrode reconstruction by FIB/SEM and microstructure modeling / Joos, Jochen [VerfasserIn] (Online-Ressource)
68368385