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Verfasst von:Dressler, Katharina [VerfasserIn]   i
 Kratt, Martina [VerfasserIn]   i
 Voss, Philipp A. [VerfasserIn]   i
 Ebert, Stefanie [VerfasserIn]   i
 Herguth, Axel [VerfasserIn]   i
 Hahn, Giso [VerfasserIn]   i
Titel:Influence of al particle size and firing profile on void formation in rear local contacts of silicon solar cells
Verf.angabe:Katharina Dressler, Martina Kratt, Philipp A. Voss, Stefanie Ebert, Axel Herguth, Giso Hahn
Jahr:2016
Jahr des Originals:2015
Umfang:6 S.
Fussnoten:Date of Publication: 29 October 2015 ; Gesehen am 27.04.2020
Titel Quelle:Enthalten in: Institute of Electrical and Electronics EngineersIEEE journal of photovoltaics
Ort Quelle:New York, NY : IEEE, 2011
Jahr Quelle:2016
Band/Heft Quelle:6(2016), 1, Seite 68-73
ISSN Quelle:2156-3403
Abstract:In this paper, the influence of Al particle size and the applied firing profile on void formation in local rear contacts of wafer-based silicon solar cells is investigated. Samples with a passivated emitter and rear cell (PERC) rear, but without front metallization, were metalized with six different Al screen-printing pastes, i.e., both commercial and homemade, featuring different particle size distributions and fired in a rapid thermal processing furnace with different firing profiles. Voids were detected with scanning acoustic microscopy measurements, and the fraction of voids in rear local contacts was analyzed. It was shown that the heating phase of the firing process has the strongest influence on void formation. With slower heating, void formation could be reduced to a fraction lower than 5% of the local contact area. Furthermore, it was shown that Al pastes consisting of a mixture of small and large Al particle sizes have a positive effect on the formation of voids.
DOI:doi:10.1109/JPHOTOV.2015.2491610
URL:Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.

Volltext: https://doi.org/10.1109/JPHOTOV.2015.2491610
 DOI: https://doi.org/10.1109/JPHOTOV.2015.2491610
Datenträger:Online-Ressource
Sprache:eng
Sach-SW:acoustic microscopy
 Al
 aluminium
 Cooling
 Crystalline silicon
 elemental semiconductors
 firing
 firing (materials)
 firing profile
 front metallization
 Heating
 Microscopy
 particle size
 passivated emitter and rear cell (PERC)
 PERC rear
 Photovoltaic cells
 Photovoltaic systems
 rear local contacts
 scanning acoustic microscopy
 Si
 silicon
 Silicon
 solar cells
 void formation
 voids
 voids (solid)
 wafer based silicon solar cells
K10plus-PPN:1696151082
Verknüpfungen:→ Zeitschrift

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