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Verfasst von:Krapohl, David [VerfasserIn]   i
 Schübel, Armin [VerfasserIn]   i
 Fröjdh, Erik [VerfasserIn]   i
 Thungström, Göran [VerfasserIn]   i
 Fröjdh, Christer [VerfasserIn]   i
Titel:Validation of Geant4 pixel detector simulation framework by measurements with the medipix family detectors
Verf.angabe:David Krapohl, member, IEEE, Armin Schübel, Erik Fröjdh,member, IEEE, Göran Thungström, and Christer Fröjdh, member, IEEE
Jahr:2016
Umfang:8 S.
Fussnoten:Gesehen am 07.07.2020
Titel Quelle:Enthalten in: Institute of Electrical and Electronics EngineersIEEE transactions on nuclear science
Ort Quelle:New York, NY : IEEE, 1963
Jahr Quelle:2016
Band/Heft Quelle:63(2016), 3, Seite 1874-1881
ISSN Quelle:1558-1578
Abstract:Monte Carlo simulations are an extensively used tool for developing and understanding radiation detector systems. In this work, we used results of several chips and readout modes of the Medipix detector family to validate a Geant4 based pixel detector framework, developed in our group, that is capable of simulating particle tracking, charge transport in the sensor material and different readout schemes. We experimentally verified the simulation with different detector geometries in terms of pixel pitch and size as well as sensor material and sensor thickness. The single pixel mode (SPM) and charge summing mode (CSM) in Medipix3 were evaluated with fluorescence and synchrotron radiation. The integration of the charge sensitive amplifier functionality in the simulation framework allowed to simulate the time-over-threshold mode of the Timepix chip. Simulation and measurement have been compared in terms of spectral resolution using threshold scans in photon counting mode (Medipix3) and time over threshold mode (Timepix). Further comparisons were done using X-ray tube spectra and beta decay to cover a broad energy range. Additionally, TCAD simulations are performed as a comparison to a well-established simulation method. The results show good agreement between simulation and measurement.
DOI:doi:10.1109/TNS.2016.2555958
URL:Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.

Volltext: https://doi.org/10.1109/TNS.2016.2555958
 DOI: https://doi.org/10.1109/TNS.2016.2555958
Datenträger:Online-Ressource
Sprache:eng
Sach-SW:Computational modeling
 Detectors
 Electrodes
 Geometry
 Medipix
 Monte Carlo simulation
 pixel detector simulation
 Semiconductor device measurement
 Semiconductor process modeling
 Solid modeling
 Technology Computer Aided Design (TCAD)
 timepix
K10plus-PPN:1703864948
Verknüpfungen:→ Zeitschrift

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