Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment

• Verfasst von: Färber, Christian [VerfasserIn]
• Verfasst von: Uwer, Ulrich [VerfasserIn]
• Verfasst von: Wiedner, Dirk [VerfasserIn]
• Verfasst von: Leverington, Blake [VerfasserIn]
• Verfasst von: Ekelhof, R. [VerfasserIn]
• Titel: Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
• Titelzusatz: topical workshop on electronics for particle physics 2013, 23-27 september 2013, Perugia, Italy
• Verf.angabe: C. Färber, U. Uwer, D. Wiedner, B. Leverington and R. Ekelhof
• E-Jahr: 2014
• Jahr: February 24, 2014
• Umfang: 8 S.
• Fussnoten: Gesehen am 21.10.2020
• Titel Quelle: Enthalten in: Journal of Instrumentation
• Ort Quelle: London : Inst. of Physics, 2006
• Jahr Quelle: 2014
• Band/Heft Quelle: 9(2014) Artikel-Nummer C02028, 8 Seiten
• ISSN Quelle: 1748-0221
• DOI: doi:10.1088/1748-0221/9/02/C02028
• Datenträger: Online-Ressource
• Sprache: eng
• K10plus-PPN: 1736070991

Abstract

This paper describes radiation studies of a SRAM-based FPGA as a central component for a upgrade of the LHCb Outer Tracker front-end electronics to a readout frequency of 40 MHz. Two Arria GX FPGAs were irradiated with 20 MeV protons to radiation doses of up to 7 Mrad. During and between the irradiation periods the different FPGA currents, the package temperature, the firmware error rate, the PLL stability, and the stability of a 32 channel TDC implemented on the FPGA were monitored. Results on the radiation tolerance of the FPGA and the measured firmware error rates will be presented. The Arria GX FPGA fulfills the radiation tolerance required for the LHCb upgrade (30 krad) and an expected firmware error rate of roughly 10−6 Hz makes the chip a possible component for the upgraded front-end electronics.