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Verfasst von:Grande, Andrea [VerfasserIn]   i
 Fiorini, Carlo [VerfasserIn]   i
 Utica, G. [VerfasserIn]   i
 Erdinger, Florian [VerfasserIn]   i
 Fischer, Peter [VerfasserIn]   i
 Porro, Matteo [VerfasserIn]   i
Titel:Charge sensitive amplifier with offset-compensated V-to-I converter for the mini-SDD-based DSSC detector
Verf.angabe:A. Grande, C. Fiorini, G. Utica, F. Erdinger, P. Fischer, M. Porro
E-Jahr:2019
Jahr:October 2019
Umfang:6 S.
Fussnoten:Gesehen am 30.10.2020
Titel Quelle:Enthalten in: Institute of Electrical and Electronics EngineersIEEE transactions on nuclear science
Ort Quelle:New York, NY : IEEE, 1963
Jahr Quelle:2019
Band/Heft Quelle:66(2019), 10, Seite 2233-2238
ISSN Quelle:1558-1578
Abstract:In this article, we present the study and the experimental results of a charge sensitive amplifier (CSA) for the mini-silicon drift detector (SDD) pixel sensors of the DEPleted Field-Effect Transistor (DEPFET) sensor with signal compression (DSSC) detector for photon science applications at the European X-ray free electron laser (XFEL) GmbH in Hamburg area. The DSSC detector must be able to cope with an image frame rate up to 4.5 MHz and with a dynamic range up to 104 photons/pixel/pulse for a photon energy of 1 keV. These goals will be pursued with the adoption of the DEPFET detector strategy. For the first camera prototype, a simpler solution based on a mini-SDD array read out by a conventional CSA has been adopted. We present here the CSA solution with a very simple V-to-I converter stage, which allows the self-canceling of the offset current flowing between the CSA and the filter, without the need of an intermediate stage. The CSA is compatible with the same application-specified integrated circuit (ASIC) architecture and readout chain already designed for the DEPFET detector. We present two versions of the CSA: one with a linear response and another with a nonlinear output characteristic. The nonlinear version provides increased input dynamic range preserving single-photon sensitivity. The experimental measurements have demonstrated the functionality of the proposed self-canceling solution and good noise performance with an equivalent noise charge (ENC) of 65 e- rms at the 4.5-MHz frame rate and a linearity error lower than 0.25% of the complete channel. In addition, the functionality of the nonlinear version (signal compression version) of the CSA has been demonstrated, without penalty in noise performance in the linear region of the CSA response.
DOI:doi:10.1109/TNS.2019.2939198
URL:Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.

DOI: https://doi.org/10.1109/TNS.2019.2939198
Datenträger:Online-Ressource
Sprache:eng
Sach-SW:amplifiers
 application specific integrated circuits
 Charge preamplifiers
 charge sensitive amplifier
 conventional CSA
 CSA response
 CSA solution
 DEPFET detector strategy
 DEPleted Field-Effect Transistor sensor
 Detectors
 Dynamic range
 electron volt energy 1.0 keV
 equivalent noise charge
 European X-ray free electron laser GmbH
 free electron lasers
 free electron lasers (FELs)
 frequency 4.5 MHz
 image frame rate
 input dynamic range
 Iron
 low-noise amplifiers
 mini-SDD array
 mini-SDD-based DSSC detector
 mini-silicon drift detector pixel sensors
 nonlinear version
 nuclear electronics
 photon energy
 photon science applications
 Photonics
 Programming
 readout chain
 Resistors
 self-canceling solution
 semiconductor counters
 signal compression detector
 signal compression version
 silicon
 silicon radiation detectors
 simple V-to-I converter stage
 single-photon sensitivity
 Transistors
 X-ray detection
K10plus-PPN:1737452979
Verknüpfungen:→ Zeitschrift

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