Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra

• Verfasst von: Guerra, Mauro António Moreira [VerfasserIn]
• Verfasst von: Amaro, Pedro [VerfasserIn]
• Titel: Analysis of the charge state distribution in an ECRIS Ar plasma using high-resolution x-ray spectra
• Verf.angabe: M Guerra, P Amaro, CI Szabo, A Gumberidze, P Indelicato and JP Santos
• E-Jahr: 2013
• Jahr: 1 March 2013
• Umfang: 7 S.
• Teil: volume:46
• Teil: year:2013
• Teil: number:6
• Teil: elocationid:065701
• Teil: pages:1-7
• Teil: extent:7
• Fussnoten: Gesehen am 11.02.2021
• Titel Quelle: Enthalten in: Journal of physics / B
• Ort Quelle: Bristol : IOP Publ., 1968
• Jahr Quelle: 2013
• Band/Heft Quelle: 46(2013), 6, Artikel-ID 065701, Seite 1-7
• ISSN Quelle: 1361-6455
• DOI: doi:10.1088/0953-4075/46/6/065701
• Datenträger: Online-Ressource
• Sprache: eng
• K10plus-PPN: 1746333707

Abstract

In this work, we obtained a charge state distribution inside an Ar plasma produced by an electron-cyclotron-resonance ion source. The processes that lead to the observed lines in x-ray spectra are identified and included in the simulated x-ray spectrum. The geometrical constraints of the flat double crystal spectrometer, used to measure the x-ray spectrum, are investigated as they are crucial for correctly obtaining the ion densities from the observed transition amplitudes. Multiple electron impact ionization is included, and a realistic electron velocity distribution is taken into account. The charge state distribution of the Ar ions is compared to measured extracted ionic currents.