| |  Online-Ressource |
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| Verfasst von: | Hansen, Karsten [VerfasserIn]  |
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| | Klär, H. [VerfasserIn] |
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| | Kalavakuru, Pradeep [VerfasserIn] |
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| | Reckleben, Christian [VerfasserIn] |
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| | Venzmer, A. [VerfasserIn] |
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| | Wüstenhagen, E. [VerfasserIn] |
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| | Schappeit, R. [VerfasserIn] |
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| | Zeides, O.-C. [VerfasserIn] |
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| | Okrent, F. [VerfasserIn] |
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| | Wunderer, C. [VerfasserIn] |
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| | Lemke, M. [VerfasserIn] |
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| | Graafsma, H. [VerfasserIn] |
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| | Schlosser, I. [VerfasserIn] |
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| | Manghisoni, M. [VerfasserIn] |
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| | Riceputi, E. [VerfasserIn] |
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| | Aschauer, S. [VerfasserIn] |
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| | Strüder, L. [VerfasserIn] |
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| | Soldat, Jan [VerfasserIn] |
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| | Tangl, Manfred [VerfasserIn] |
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| | Erdinger, Florian [VerfasserIn] |
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| | Kugel, Andreas [VerfasserIn] |
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| | Fischer, Peter [VerfasserIn] |
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| | Andricek, L. [VerfasserIn] |
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| | Ninković, J. [VerfasserIn] |
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| | Turcato, Monica [VerfasserIn] |
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| | Porro, Matteo [VerfasserIn] |
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| Titel: | Qualification and integration aspects of the DSSC mega-pixel X-Ray imager |
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| Verf.angabe: | K. Hansen, H. Klär, P. Kalavakuru, C. Reckleben, A. Venzmer, E. Wüstenhagen, R. Schappeit, O.-C. Zeides, F. Okrent, C. Wunderer, M. Lemke, H. Graafsma, I. Schlosser, M. Manghisoni, E. Riceputi, S. Aschauer, L. Strüder, J. Soldat, M. Tangl, F. Erdinger, A. Kugel, P. Fischer, L. Andricek, J. Ninković, M. Turcato, and M. Porro |
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| E-Jahr: | 2019 |
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| Jahr: | August 2019 |
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| Umfang: | 10 S. |
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| Fussnoten: | Gesehen am 28.01.2022 |
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| Titel Quelle: | Enthalten in: Institute of Electrical and Electronics EngineersIEEE transactions on nuclear science |
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| Ort Quelle: | New York, NY : IEEE, 1963 |
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| Jahr Quelle: | 2019 |
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| Band/Heft Quelle: | 66(2019), 8, Seite 1966-1975 |
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| ISSN Quelle: | 1558-1578 |
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| Abstract: | The focal-plane module is the key component of the DEPFET sensor with signal compression (DSSC) mega-pixel X-ray imager and handles the data of 128 × 512 pixels. We report on assembly-related aspects, discuss the experimental investigation of bonding behavior of different adhesives, and present the metrology and electrical test results of the production. The module consists of two silicon (Si) sensors with flip-chip connected CMOS integrated circuits, a Si-heat spreader, a low-temperature co-fired ceramics circuit board, and a molybdenum frame. A low-modulus urethane-film adhesive fills the gaps between on-board components and frame. It is also used between board and heat spreader, reduces the misfit strain, and minimizes the module warpage very efficiently. The heat spreader reduces the on-board temperature gradient by about one order of magnitude. The placement precision of the bare modules to each other and the frame is characterized by a standard deviation below 10 and 65 μm, respectively. The displacement due to the in-plane rotation and vertical tilting errors remains below 80 and 50 μm, respectively. The deflection of the sensor plane shows a mean value below 30 μm with a standard deviation below 15 μm. Less than 4% of the application-specified integrated circuits (ASICs) exhibit a malfunction. More than two-thirds of the sensors have a maximum leakage current below 1 μA. |
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| DOI: | doi:10.1109/TNS.2019.2927421 |
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| URL: | Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.
DOI: https://doi.org/10.1109/TNS.2019.2927421 |
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| Datenträger: | Online-Ressource |
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| Sprache: | eng |
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| Sach-SW: | Adhesive strength |
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| | assembly |
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| | Bonding |
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| | Cameras |
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| | circuit testing |
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| | Curing |
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| | Heating systems |
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| | hybrid integrated circuits |
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| | image sensor |
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| | metrology |
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| | packaging technology |
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| | Silicon |
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| | Strain |
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| | X-ray detector |
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| | X-ray imaging |
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| K10plus-PPN: | 1787368386 |
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| Verknüpfungen: | → Zeitschrift |
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Qualification and integration aspects of the DSSC mega-pixel X-Ray imager / Hansen, Karsten [VerfasserIn]; August 2019 (Online-Ressource)
