| Online-Ressource |
Verfasst von: | Lehr, Dennis [VerfasserIn] ![i](/opacicon/information2.png) |
| Helgert, Michael [VerfasserIn] ![i](/opacicon/information2.png) |
| Sundermann, Michael [VerfasserIn] ![i](/opacicon/information2.png) |
| Morhard, Christoph [VerfasserIn] ![i](/opacicon/information2.png) |
| Pacholski, Claudia [VerfasserIn] ![i](/opacicon/information2.png) |
| Spatz, Joachim P. [VerfasserIn] ![i](/opacicon/information2.png) |
| Brunner, Robert [VerfasserIn] ![i](/opacicon/information2.png) |
Titel: | Simulating different manufactured antireflective sub-wavelength structures considering the influence of local topographic variations |
Verf.angabe: | Dennis Lehr, Michael Helgert, Michael Sundermann, Christoph Morhard, Claudia Pacholski, Joachim P. Spatz, and Robert Brunner |
E-Jahr: | 2010 |
Jahr: | 29 Oct 2010 |
Umfang: | 13 S. |
Fussnoten: | Gesehen am 13.03.2023 |
Titel Quelle: | Enthalten in: Optics express |
Ort Quelle: | Washington, DC : Optica, 1997 |
Jahr Quelle: | 2010 |
Band/Heft Quelle: | 18(2010), 23 vom: Okt., Seite 23878-23890 |
ISSN Quelle: | 1094-4087 |
Abstract: | Laterally structured antireflective sub-wavelength structures show unique properties with respect to broadband performance, damage threshold and thermal stability. Thus they are superior to classical layer based antireflective coatings for a number of applications. Dependent on the selected fabrication technology the local topography of the periodic structure may deviate from the perfect repetition of a sub-wavelength unit cell. We used rigorous coupled-wave analysis (RCWA) to simulate the efficiency losses due to scattering effects based on height and displacement variations between the individual protuberances. In these simulations we chose conical and Super-Gaussian shapes to approximate the real profile of structures fabricated in fused silica. The simulation results are in accordance with the experimentally determined optical properties of sub-wavelength structures over a broad wavelength range. Especially the transmittance reduction in the deep-UV could be ascribed to these variations in the sub-wavelength structures. |
DOI: | doi:10.1364/OE.18.023878 |
URL: | Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.
Volltext: https://doi.org/10.1364/OE.18.023878 |
| Volltext: https://opg.optica.org/oe/abstract.cfm?uri=oe-18-23-23878 |
| DOI: https://doi.org/10.1364/OE.18.023878 |
Datenträger: | Online-Ressource |
Sprache: | eng |
Sach-SW: | Antireflection coatings |
| Damage |
| Optical properties |
| Spatial frequency |
| Subwavelength structures |
| Thin films |
K10plus-PPN: | 1839001410 |
Verknüpfungen: | → Zeitschrift |
Simulating different manufactured antireflective sub-wavelength structures considering the influence of local topographic variations / Lehr, Dennis [VerfasserIn]; 29 Oct 2010 (Online-Ressource)