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| Verfasst von: | Zhang, Wen-Shan [VerfasserIn]  |
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| | Matthiesen, Maik [VerfasserIn] |
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| | Günther, Benjamin [VerfasserIn] |
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| | Wensorra, Jakob [VerfasserIn] |
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| | Fischer, Daniel [VerfasserIn] |
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| | Gade, Lutz H. [VerfasserIn] |
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| | Zaumseil, Jana [VerfasserIn] |
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| | Schröder, Rasmus R. [VerfasserIn] |
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| Titel: | Visualizing the active paths in morphologically defective organic thin-film transistors |
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| Verf.angabe: | Wen-Shan Zhang, Maik Matthiesen, Benjamin Günther, Jakob Wensorra, Daniel Fischer, Lutz H. Gade, Jana Zaumseil, and Rasmus R. Schröder |
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| E-Jahr: | 2021 |
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| Jahr: | August 25, 2021 |
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| Umfang: | 10 S. |
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| Fussnoten: | Gesehen am 27.03.2023 |
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| Titel Quelle: | Enthalten in: Advanced electronic materials |
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| Ort Quelle: | Weinheim : Wiley-VCH Verlag GmbH & Co. KG, 2015 |
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| Jahr Quelle: | 2021 |
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| Band/Heft Quelle: | 7(2021), 11, Artikel-ID 2100400, Seite 1-10 |
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| ISSN Quelle: | 2199-160X |
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| Abstract: | The charge-carrier mobility of organic semiconductors extracted from thin-film transistors is highly dependent on film morphology. Morphological defects can lead to the underestimation of charge transport properties, which may impede the rational design of novel materials. Herein, a novel analytical method is presented to functionally characterize entire active layers of solution-processed thin-film transistors. By correlating imaging and spectroscopy of secondary electrons, nano-sized morphological defects are discovered and the effective current paths between source and drain electrodes are directly visualized. After image-processing, the as-measured mobility values of zone-cast thin-films of a tetraazaperopyrene derivative are corrected, obtaining charge-carrier mobilities of up to five times higher than the as-measured values. The direct visualization of the electric functionality of the organic thin-films facilitates a unique quantification of the impact of morphological defects and provides a solid benchmark to estimate the potential for further improvement of device performance. |
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| DOI: | doi:10.1002/aelm.202100400 |
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| URL: | kostenfrei: Volltext: https://doi.org/10.1002/aelm.202100400 |
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| | kostenfrei: Volltext: https://onlinelibrary.wiley.com/doi/abs/10.1002/aelm.202100400 |
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| | DOI: https://doi.org/10.1002/aelm.202100400 |
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| Datenträger: | Online-Ressource |
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| Sprache: | eng |
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| Sach-SW: | analytic SEM |
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| | charge neutral energy |
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| | charge-carrier mobility correction |
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| | micromorphology |
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| | organic thin-film transistors |
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| K10plus-PPN: | 1840191201 |
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| Verknüpfungen: | → Zeitschrift |
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| Lokale URL UB: |  Zum Volltext |
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Visualizing the active paths in morphologically defective organic thin-film transistors / Zhang, Wen-Shan [VerfasserIn]; August 25, 2021 (Online-Ressource)
