Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation

• Verfasst von: Meinen, Jan [VerfasserIn]
• Verfasst von: Khasminskaya, Svetlana [VerfasserIn]
• Verfasst von: Eritt, Markus [VerfasserIn]
• Verfasst von: Leisner, Thomas [VerfasserIn]
• Verfasst von: Antonsson, Egill [VerfasserIn]
• Verfasst von: Langer, Burkhard [VerfasserIn]
• Verfasst von: Rühl, Eckart [VerfasserIn]
• Titel: Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation
• Verf.angabe: Jan Meinen, Svetlana Khasminskaya, Markus Eritt, Thomas Leisner, Egill Antonsson, Burkhard Langer, and Eckart Rühl
• E-Jahr: 2010
• Jahr: 26 August 2010
• Umfang: 4 S.
• Fussnoten: Gesehen am 13.04.2023
• Titel Quelle: Enthalten in: Review of scientific instruments
• Ort Quelle: [Erscheinungsort nicht ermittelbar] : American Institute of Physics, 1930
• Jahr Quelle: 2010
• Band/Heft Quelle: 81(2010), 8, Artikel-ID 085107, Seite 1-4
• ISSN Quelle: 1089-7623
• DOI: doi:10.1063/1.3475154
• Datenträger: Online-Ressource
• Sprache: eng
• K10plus-PPN: 1842478443

Abstract

A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the - Si  - L - 3,2 - Si L3,2 - -edge on 8.2 nm - SiO - 2 - SiO2 - particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.