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Status: Bibliographieeintrag
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Titel:Volume microscopy
Titelzusatz:multiscale imaging with photons, electrons, and ions
Mitwirkende:Wacker, Irene [HerausgeberIn]   i
 Hummel, Eric [HerausgeberIn]   i
 Burgold, Steffen [HerausgeberIn]   i
 Schröder, Rasmus R. [HerausgeberIn]   i
Verf.angabe:edited by Irene Wacker (Cryo EM, Centre for Advances Materials (CAM), Universität Heidelberg, Heidelberg, Germany), Eric Hummel (Sector Life Science, Carl Zeiss Microscopy GmbH, Oberkochen, Germany ; Carls Zeiss, Oberkochen, Germany), Steffen Burgold (BioQuant, Universität Heidelberg, Heidelberg, Germany ; Cryo EM, BioQuant, Universitätsklinikum Heidelberg, Heidelberg, Germany), Rasmus Schröder (Cryo EM, BioQuant, Universitätsklinikum Heidelberg, Heidelberg, Germany ; Cryo EM, Centre for Advances Materials (CAM), Universität Heidelberg, Heidelberg, Germany)
Ausgabe:1st ed. 2020.
Verlagsort:New York, NY
 New York, NY
Verlag:Springer US
 Imprint: Humana
E-Jahr:2020
Jahr:2020.
 2020.
Umfang:1 Online-Ressource (XVII, 306 p. 107 illus., 88 illus. in color.)
Gesamttitel/Reihe:Neuromethods ; 155
ISBN:978-1-0716-0691-9
Abstract:Correlative Super Resolution and Electron Microscopy to Detect Molecules in their Native Cellular Context -- Multi-Color Super-Resolution Microscopy: Revealing the Nano-World of Astrocytes In Situ -- High Resolution Molecular Imaging and Its Applications in Brain and Synapses -- Advancing Array Tomography to Study the Fine Ultrastructure of Identified Neurons in Zebrafish (Danio rerio) -- A Low-Tech Approach to Serial Section Arrays -- Large Volumes in Ultrastructural Neuropathology Imaged by Array Tomography of Routine Diagnostic Samples -- Correlative Ultrastructural Analysis of Functionally Modulated Synapses using Automated Tape-Collecting Ultramicrotome and SEM Array Tomography -- Large-Scale Automated Serial Section Imaging using a Multi-Beam Scanning Electron Microscope -- Improving Serial Blockface SEM by Focal Charge Compensation -- Using X-Ray Microscopy to Increase Targeting Accuracy in Serial Block-Face Scanning Electron Microscopy -- FIBSEM Analysis of Interfaces between Hard Technical Devices and Soft Neuronal Tissue -- Transforming FIB-SEM Systems for Large Volume Connectomics and Cell Biology -- Image Processing for Volume Electron Microscopy -- Forget about Electron Micrographs: A Novel Guide for using 3D Models for Quantitative Analysis of Dense Reconstructions.
 This volume discusses different approaches to workflows for large volume electron microscopy - from preparation of samples to their imaging in a variety of microscopes - in some cases also applying correlative techniques. The chapters in this book cover topics such as correlative super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays; improving serial blockface SEM by focal charge compensation; FIBSEM analysis of interfaces between hard technical devices and soft neuronal tissue; and image processing for volume electron microscopy. In Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory. Cutting-edge and authoritative, Volume Microscopy: Multiscale Imaging with Photons, Electrons, and Ions is a valuable resource for novice and expert scientists interested in learning more about this evolving field.
DOI:doi:10.1007/978-1-0716-0691-9
URL:Bitte beachten Sie: Dies ist ein Bibliographieeintrag. Ein Volltextzugriff für Mitglieder der Universität besteht hier nur, falls für die entsprechende Zeitschrift/den entsprechenden Sammelband ein Abonnement besteht oder es sich um einen OpenAccess-Titel handelt.

Resolving-System: https://doi.org/10.1007/978-1-0716-0691-9
 DOI: https://doi.org/10.1007/978-1-0716-0691-9
Datenträger:Online-Ressource
Sprache:eng
Bibliogr. Hinweis:Erscheint auch als : Druck-Ausgabe
 Erscheint auch als : Druck-Ausgabe
 Erscheint auch als : Druck-Ausgabe
 Erscheint auch als : Druck-Ausgabe: Volume microscopy. - New York, NY : Humana Press, 2020. - xvii, 306 Seiten
RVK-Notation:WW 2200   i
K10plus-PPN:1724268155

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