Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity

• Verfasst von: Kreuzer, Martin [VerfasserIn]
• Verfasst von: Kaltofen, Thomas [VerfasserIn]
• Verfasst von: Steitz, Roland [VerfasserIn]
• Verfasst von: Zehnder, Beat H. [VerfasserIn]
• Verfasst von: Dahint, Reiner [VerfasserIn]
• Titel: Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity
• Verf.angabe: Martin Kreuzer, Thomas Kaltofen, Roland Steitz, Beat H. Zehnder, Reiner Dahint
• E-Jahr: 2011
• Jahr: 09 February 2011
• Umfang: 8 S.
• Fussnoten: Gesehen am 11.07.2022
• Titel Quelle: Enthalten in: Review of scientific instruments
• Ort Quelle: [S.l.] : American Institute of Physics, 1930
• Jahr Quelle: 2011
• Band/Heft Quelle: 82(2011), 2, Artikel-ID 023902, Seite 1-8
• ISSN Quelle: 1089-7623
• DOI: doi:10.1063/1.3505797
• Datenträger: Online-Ressource
• Sprache: eng
• K10plus-PPN: 1809684625

Abstract

We describe an apparatus for measuring scattering length density and structure of molecular layers at planar solid-liquid interfaces under high hydrostatic pressure conditions. The device is designed for in situ characterizations utilizing neutron reflectometry in the pressure range 0.1-100 MPa at temperatures between 5 and 60 °C. The pressure cell is constructed such that stratified molecular layers on crystalline substrates of silicon, quartz, or sapphire with a surface area of 28 cm2 can be investigated against noncorrosive liquid phases. The large substrate surface area enables reflectivity to be measured down to 10−5 (without background correction) and thus facilitates determination of the scattering length density profile across the interface as a function of applied load. Our current interest is on the stability of oligolamellar lipid coatings on silicon surfaces against aqueous phases as a function of applied hydrostatic pressure and temperature but the device can also be employed to probe the structure of any other solid-liquid interface.